Channel conductivity in memory structures

Invention Grant

US10854746B2 Channel conductivity in memory structures 有权

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Patent Title: Channel conductivity in memory structures
Application No.: US16190135

Application Date: 2018-11-13
Publication No.: US10854746B2

Publication Date: 2020-12-01
Inventor: Prashant Majhi , Khaled Hasnat , Krishna Parat
Applicant: Intel Corporation
Applicant Address: US CA Santa Clara
Assignee: Intel Corporation
Current Assignee: Intel Corporation
Current Assignee Address: US CA Santa Clara
Agency: Compass IP Law PC
Main IPC: H01L29/792
IPC: H01L29/792 ; H01L29/78 ; H01L27/11524 ; H01L27/11556 ; H01L29/04 ; H01L27/11582 ; H01L29/16 ; H01L27/1157 ; H01L21/28

Channel conductivity in memory structures

Abstract:

A memory structure can include a conductive channel, a charge storage structure adjacent to the conductive channel, and a strain-inducing layer adjacent to the conductive channel on a side opposite the charge storage structure. The strain-inducing layer can have a higher coefficient of thermal expansion (CTE) than the conductive channel.

Public/Granted literature

US20200152793A1 CHANNEL CONDUCTIVITY IN MEMORY STRUCTURES Public/Granted day:2020-05-14

Information query

Espacenet

IPC分类:

H	电学
H01	基本电气元件
H01L	半导体器件；其他类目中不包括的电固体器件（使用半导体器件的测量入G01；一般电阻器入H01C；磁体、电感器、变压器入H01F；一般电容器入H01G；电解型器件入H01G9/00；电池组、蓄电池入H01M；波导管、谐振器或波导型线路入H01P；线路连接器、汇流器入H01R；受激发射器件入H01S；机电谐振器入H03H；扬声器、送话器、留声机拾音器或类似的声机电传感器入H04R；一般电光源入H05B；印刷电路、混合电路、电设备的外壳或结构零部件、电气元件的组件的制造入H05K；在具有特殊应用的电路中使用的半导体器件见应用相关的小类）
H01L29/00	专门适用于整流、放大、振荡或切换，并具有至少一个电位跃变势垒或表面势垒的半导体器件；具有至少一个电位跃变势垒或表面势垒，例如PN结耗尽层或载流子集结层的电容器或电阻器；半导体本体或其电极的零部件（H01L31/00至H01L47/00，H01L51/05优先；除半导体或其电极之外的零部件入H01L23/00；由在一个共用衬底内或其上形成的多个固态组件组成的器件入H01L27/00）
H01L29/66	.按半导体器件的类型区分的
H01L29/68	..只能通过对一个不通有待整流、放大或切换的电流的电极供给电流或施加电位方可进行控制的（H01L29/96优先）
H01L29/76	...单极器件
H01L29/772	....场效应晶体管
H01L29/78	.....由绝缘栅产生场效应的
H01L29/792	......带有电荷捕获栅绝缘体，例如MNOS存储晶体管