Invention Grant
- Patent Title: Transistor with multiple GaN-based alloy layers
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Application No.: US16216874Application Date: 2018-12-11
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Publication No.: US10861943B2Publication Date: 2020-12-08
- Inventor: Dong Seup Lee , Jungwoo Joh , Pinghai Hao , Sameer Pendharkar
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Jacqueline J. Garner; Charles A. Brill; Frank D. Cimino
- Main IPC: H01L29/20
- IPC: H01L29/20 ; H01L29/778 ; H01L29/66

Abstract:
In some examples, a transistor comprises a gallium nitride (GaN) layer; a first GaN-based alloy layer having a top side and disposed on the GaN layer; a second GaN-based alloy layer disposed on the first GaN-based alloy layer, wherein the second GaN-based alloy layer covers a first portion of the top side; and a source contact structure, a drain contact structure, and a gate contact structure, wherein the source, drain, and gate contact structures are supported by the first GaN-based alloy layer.
Public/Granted literature
- US20200185499A1 TRANSISTOR WITH MULTIPLE GAN-BASED ALLOY LAYERS Public/Granted day:2020-06-11
Information query
IPC分类: