Invention Grant
- Patent Title: Customized parameterization of read parameters after a decoding failure for solid state storage devices
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Application No.: US16259346Application Date: 2019-01-28
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Publication No.: US10891189B2Publication Date: 2021-01-12
- Inventor: Zheng Wang , Ara Patapoutian , Bengt Anders Ulriksson
- Applicant: Seagate Technology LLC
- Applicant Address: US CA Cupertino
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Cupertino
- Agency: Taylor English Duma LLP
- Main IPC: H03M13/11
- IPC: H03M13/11 ; G06F11/10 ; G11C11/56 ; G06F11/00

Abstract:
Read parameter estimation techniques are provided that obtain information from multiple read operations to customize read parameters for data recovery. One method comprises performing the following steps, in response to a decoding failure of a page of a memory or a codeword of the memory: obtaining at least three read values of the page or codeword; and processing the at least three read values to determine read parameters comprising: (i) a log likelihood ratio, and/or (ii) a center read reference voltage, wherein the determination is based on a signal count of a number of bits falling in particular regions of multiple regions of the memory and wherein the determined read parameters are used for a decoding of the page or codeword following the decoding failure and/or a subsequent read operation following a successful decoding of the page or codeword.
Public/Granted literature
- US20200241959A1 CUSTOMIZED PARAMETERIZATION OF READ PARAMETERS AFTER A DECODING FAILURE FOR SOLID STATE STORAGE DEVICES Public/Granted day:2020-07-30
Information query
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