Invention Grant
- Patent Title: Electrostatic discharge protection circuit for bypassing an ESD current
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Application No.: US15878421Application Date: 2018-01-24
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Publication No.: US10897131B2Publication Date: 2021-01-19
- Inventor: Yu-Cheng Liao , Ting-Yao Lin , Ping-Chen Chang , Tien-Hao Tang
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Main IPC: H02H9/00
- IPC: H02H9/00 ; H02H9/04 ; H02H1/00 ; H01L27/02 ; H01L27/06

Abstract:
An electrostatic discharge (ESD) protection circuit has a first power node, a second power node, an ESD detect circuit, an ESD device and a voltage controlled switch. The ESD detect circuit is coupled between the first power node and the second power node for detecting an ESD current to output a control signal at a output terminal of the ESD detect circuit. The ESD device is coupled between the first power node and the second power node for leaking the ESD current. The voltage controlled switch is used to couple a body of the ESD device to the second power node according to at least a voltage level of the control signal.
Public/Granted literature
- US20190229531A1 Electrostatic discharge protection circuit for bypassing an ESD current Public/Granted day:2019-07-25
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