Invention Grant
- Patent Title: Surveying system
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Application No.: US15968881Application Date: 2018-05-02
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Publication No.: US10921430B2Publication Date: 2021-02-16
- Inventor: Fumio Ohtomo , Kaoru Kumagai , Tetsuji Anai
- Applicant: TOPCON Corporation
- Applicant Address: JP Tokyo-to
- Assignee: TOPCON Corporation
- Current Assignee: TOPCON Corporation
- Current Assignee Address: JP Tokyo-to
- Agency: Nields, Lemack & Frame, LLC
- Priority: JP2017-093801 20170510
- Main IPC: G01S7/48
- IPC: G01S7/48 ; G01S7/481 ; G01C15/00 ; G01S17/42 ; G01S3/782 ; G01S3/789 ; G01S17/66 ; G01S17/86 ; G01S17/46 ; G01C15/06

Abstract:
A target instrument has an illuminating lamp, wherein a total station has an optical axis deflector capable of deflecting a distance measuring optical axis, a projecting direction detecting module for performing an angle measurement of the distance measuring optical axis, an image pickup unit, and an arithmetic control module for controlling a deflecting action of the optical axis deflector and a distance measuring action of a distance measuring unit, wherein the arithmetic control module is configured to detect an illumination light from an image acquired by the image pickup unit, to acquire a direction of the illuminating lamp based on a detection result, to make the optical axis deflector to scan with a distance measuring light around the acquired direction and to perform a distance measurement and an angle measurement along a scanning path.
Public/Granted literature
- US20180329040A1 Surveying System Public/Granted day:2018-11-15
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