- 专利标题： Testing device, testing system, and testing method
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申请号： US16184879申请日： 2018-11-08
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公开(公告)号： US10955451B2公开(公告)日： 2021-03-23
- 发明人: Yen-Chun Wang , Hung-Jen Huang , Chen-Kuo Chu , I-Chun Liu
- 申请人： ASE TEST, INC.
- 申请人地址： TW Kaohsiung
- 专利权人： ASE TEST, INC.
- 当前专利权人： ASE TEST, INC.
- 当前专利权人地址： TW Kaohsiung
- 代理机构： Foley & Lardner LLP
- 主分类号： G01R29/10
- IPC分类号： G01R29/10 ; G01R31/00 ; G01R1/04 ; G01R31/28 ; G01R31/302
摘要：
A testing device includes a testing socket, a first transmission medium and a second transmission medium. The testing socket defines a radiation space. The first transmission medium is disposed in the radiation space of the testing socket. The first transmission medium is configured for supporting a device under test (DUT). The second transmission medium is disposed in the radiation space of the testing socket.
公开/授权文献
- US20190162767A1 TESTING DEVICE, TESTING SYSTEM, AND TESTING METHOD 公开/授权日：2019-05-30
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