公开(公告)号：US10955451B2

公开(公告)日：2021-03-23

申请号：US16184879

申请日：2018-11-08

申请人： ASE TEST, INC.

发明人： Yen-Chun Wang ,  Hung-Jen Huang ,  Chen-Kuo Chu ,  I-Chun Liu

IPC分类号： G01R29/10 ,  G01R31/00 ,  G01R1/04 ,  G01R31/28 ,  G01R31/302

摘要： A testing device includes a testing socket, a first transmission medium and a second transmission medium. The testing socket defines a radiation space. The first transmission medium is disposed in the radiation space of the testing socket. The first transmission medium is configured for supporting a device under test (DUT). The second transmission medium is disposed in the radiation space of the testing socket.

公开(公告)号：US12032001B2

公开(公告)日：2024-07-09

申请号：US17722219

申请日：2022-04-15

申请人： Advanced Semiconductor Engineering, Inc. ,  ASE TEST, INC.

发明人： Jia Jin Lin ,  Chia Hsiang Wang ,  Shih Pin Chung ,  Wei Shuo Chu ,  You Lin Lee ,  Pin Heng Kuo ,  Cheng Chia Tu

IPC分类号： G01R31/26 ,  G01R1/04 ,  G01R31/28

CPC分类号： G01R1/0466 ,  G01R31/2863

摘要： A testing device is disclosed. The testing device includes a socket configured to support a DUT and a first detection module disposed at a first side of the socket and configured to detect a location relationship between the DUT and the socket.

公开(公告)号：US11656270B2

公开(公告)日：2023-05-23

申请号：US16408328

申请日：2019-05-09

申请人： ASE TEST, INC.

发明人： Chun-Hung Sun ,  Yi-Ting Liu

IPC分类号： G01R31/28 ,  G06T11/20

CPC分类号： G01R31/2834 ,  G06T11/206

摘要： An apparatus is provided that includes a control unit and a memory including computer program code. The apparatus is capable of applying a first signal having a first value and a second signal having a second value to an electronic component and receiving a first feedback signal. The apparatus is capable of determining a first parameter associated with the first feedback signal. The apparatus is capable of applying a third signal having a third value and the second signal to the electronic component and receiving a second feedback signal. The apparatus is capable of determining a second parameter associated with the second feedback signal. The apparatus is capable of applying a fourth signal having a fourth value and the second signal to the electronic component if the first parameter is different from the second parameter.

公开(公告)号：US20190162767A1

公开(公告)日：2019-05-30

申请号：US16184879

申请日：2018-11-08

申请人： ASE TEST, INC.

发明人： YEN-CHUN WANG ,  Hung-Jen HUANG ,  Chen-Kuo CHU ,  I-Chun LIU

IPC分类号： G01R29/10

摘要： A testing device includes a testing socket, a first transmission medium and a second transmission medium. The testing socket defines a radiation space. The first transmission medium is disposed in the radiation space of the testing socket. The first transmission medium is configured for supporting a device under test (DUT). The second transmission medium is disposed in the radiation space of the testing socket.

公开(公告)号：US20230333139A1

公开(公告)日：2023-10-19

申请号：US17722219

申请日：2022-04-15

申请人： Advanced Semiconductor Engineering, Inc. ,  ASE TEST, INC.

发明人： Jia Jin LIN ,  Chia Hsiang WANG ,  Shih Pin CHUNG ,  Wei Shuo CHU ,  You Lin LEE ,  Pin Heng KUO ,  Cheng Chia TU

IPC分类号： G01R1/04 ,  G01R31/28

CPC分类号： G01R1/0466 ,  G01R31/2863

摘要： A testing device is disclosed. The testing device includes a socket configured to support a DUT and a first detection module disposed at a first side of the socket and configured to detect a location relationship between the DUT and the socket.

公开(公告)号：US11085958B2

公开(公告)日：2021-08-10

申请号：US16435384

申请日：2019-06-07

申请人： ASE TEST, INC.

发明人： Yen-Chun Wang

IPC分类号： G01R29/08 ,  H04B17/10

摘要： An antenna testing module includes a box, a platform within the box, and a detection module at least partially within the box. The box is configured to accommodate a device under test (DUT). The platform is configured to hold the DUT. The detection module is configured to receive an electromagnetic radiation emitted from the DUT and to locate an antenna phase center of the DUT.

公开(公告)号：US10753973B2

公开(公告)日：2020-08-25

申请号：US15956703

申请日：2018-04-18

申请人： Advanced Semiconductor Engineering, Inc.

发明人： Zi-Ning Mao

IPC分类号： G01R31/319 ,  G01R23/02 ,  G01R1/04

摘要： A test apparatus includes a first insulation housing, a second insulation housing configured to be coupled to the first insulation housing, and a test board including a first portion and a second portion. The first insulation housing and the second insulation housing are configured to cover the first portion of the test board and to expose the second portion of the test board.