Invention Grant
- Patent Title: Configurable associated repair addresses and circuitry for a memory device
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Application No.: US16388847Application Date: 2019-04-18
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Publication No.: US10984884B2Publication Date: 2021-04-20
- Inventor: Christopher Gordon Wieduwilt , Kevin Gustav Werhane
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Fletcher Yoder, P.C.
- Main IPC: G11C29/44
- IPC: G11C29/44 ; G11C29/24 ; G11C29/12

Abstract:
A memory device includes a memory bank having multiple addressable groups of memory cells. The multiple addressable groups of memory cells include a primary set of addressable groups and a secondary set of addressable groups. The memory bank has a control circuitry that activates an addressable group with the control circuitry including repair address match circuitry that includes dynamic selection circuitry having multiple first inputs that receive row address values corresponding to the primary set. The dynamic selection circuitry includes one or more second inputs configured to receive one or more fused address values corresponding to the secondary set of addressable groups. The dynamic selection circuitry includes an output configured to selectively transmit a result that is based at least in part on a selection of one or more first inputs and a comparison of the selected one or more first inputs with the one or more the second inputs.
Public/Granted literature
- US20200335175A1 CONFIGURABLE ASSOCIATED REPAIR ADDRESSES AND CIRCUITRY FOR A MEMORY DEVICE Public/Granted day:2020-10-22
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