Invention Grant
- Patent Title: Memory with programmable die refresh stagger
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Application No.: US16502680Application Date: 2019-07-03
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Publication No.: US10991413B2Publication Date: 2021-04-27
- Inventor: Dale H. Hiscock , Michael Kaminski , Joshua E. Alzheimer , John H. Gentry
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: G11C11/406
- IPC: G11C11/406 ; G11C11/4074 ; G11C11/4096

Abstract:
Memory devices and systems with configurable die refresh stagger, and associated methods, are disclosed herein. In one embodiment, a memory system includes two or more memory dies. At least one memory die includes a fuse array storing refresh information that specifies a refresh group of the memory die. In these and other embodiments, at least one memory die includes a refresh group terminal and refresh group detect circuitry electrically connected to the refresh group terminal. The at least one memory die is configured to detect a refresh group of the memory die and to delay its refresh operation by a time delay corresponding to the refresh group. In this manner, refresh operations of the two or more memory dies can be staggered to reduce peak current demand of the memory system.
Public/Granted literature
- US20210005244A1 MEMORY WITH PROGRAMMABLE DIE REFRESH STAGGER Public/Granted day:2021-01-07
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