- 专利标题: Anti-fuse device, circuit, methods, and layout
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申请号: US16460266申请日: 2019-07-02
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公开(公告)号: US11031407B2公开(公告)日: 2021-06-08
- 发明人: Min-Shin Wu , Meng-Sheng Chang , Shao-Yu Chou , Yao-Jen Yang
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Hauptman Ham, LLP
- 主分类号: G11C17/00
- IPC分类号: G11C17/00 ; H01L27/112 ; G11C17/18 ; G11C17/16
摘要:
An IC device includes an anti-fuse device including a dielectric layer between a first gate structure and an active area, a first transistor including a second gate structure overlying the active area, and a second transistor including a third gate structure overlying the active area. The first gate structure is between the second gate structure and the third gate structure.
公开/授权文献
- US20200075610A1 ANTI-FUSE DEVICE, CIRCUIT, METHODS, AND LAYOUT 公开/授权日:2020-03-05
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