Invention Grant
- Patent Title: Method of forming polysilicon film and film forming apparatus
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Application No.: US16685627Application Date: 2019-11-15
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Publication No.: US11062904B2Publication Date: 2021-07-13
- Inventor: Yutaka Motoyama , Atsushi Endo
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer; Tanya E. Harkins
- Priority: JPJP2018-215345 20181116
- Main IPC: H01L21/20
- IPC: H01L21/20 ; H01L21/02 ; H01L21/306 ; C23C16/52 ; C23C16/24 ; C23C16/06 ; H01L21/67 ; H01L27/11582 ; H01L27/11556

Abstract:
There is provided a method of forming a polysilicon film, which includes: forming an amorphous silicon film on a substrate; forming a cap layer, which is formed of an amorphous germanium film or an amorphous silicon germanium film, on the amorphous silicon film; forming crystal nuclei of a silicon in the amorphous silicon film by heating the substrate at a first temperature; removing the cap layer after the crystal nuclei are formed; and growing the crystal nuclei by heating the substrate from which the cap layer is removed, at a second temperature equal to or higher than the first temperature.
Public/Granted literature
- US20200161130A1 METHOD OF FORMING POLYSILICON FILM AND FILM FORMING APPARATUS Public/Granted day:2020-05-21
Information query
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