- 专利标题: Composition for etching, method for etching insulator and method for manufacturing semiconductor device, and novel compounds
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申请号: US16886944申请日: 2020-05-29
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公开(公告)号: US11066601B2公开(公告)日: 2021-07-20
- 发明人: Cheol Woo Kim , Min Kyung Seon , Yu Na Shim , Jae Hoon Kwak , Young Bom Kim , Jong Ho Lee , Jin Kyung Jo
- 申请人: SK Innovation Co., Ltd. , SK-Materials Co., Ltd.
- 申请人地址: KR Seoul; KR Yeongju-si
- 专利权人: SK Innovation Co., Ltd.,SK-Materials Co., Ltd.
- 当前专利权人: SK Innovation Co., Ltd.,SK-Materials Co., Ltd.
- 当前专利权人地址: KR Seoul; KR Yeongju-si
- 代理机构: Oblon, McClelland, Maier & Neustadt, L.L.P.
- 优先权: KR10-2019-0063737 20190530
- 主分类号: C09K13/06
- IPC分类号: C09K13/06 ; C07F7/18 ; H01L21/4757
摘要:
An etching composition contains phosphoric acid, phosphoric anhydride, a compound represented by the following Formula 1, and a silane compound comprising at least one silicon (Si) atom, excluding the compound represented by Formula 1: wherein, in Formula 1, A is an n-valent radical, where n is an integer of 1 to 6, L is a direct bond or hydrocarbylene, Y is selected from NR1, O, PR2 and S, where R1 to R2 are independently hydrogen, halogen, a substituted or unsubstituted hydrocarbyl group, or non-hydrocarbyl group, X and Z are independently selected from N, O, P and S, and Ra to Rc are independently an unshared electron pair, hydrogen, or a substituted or unsubstituted hydrocarbyl group.
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