Invention Grant
- Patent Title: Method for analyzing process output and method for creating equipment parameter model
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Application No.: US15497489Application Date: 2017-04-26
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Publication No.: US11074376B2Publication Date: 2021-07-27
- Inventor: Ya-Ching Cheng , Chun-Liang Hou , Chien-Hung Chen , Wen-Jung Liao , Min-Chin Hsieh , Da-Ching Liao , Li-Chin Wang
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsinchu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, PC
- Main IPC: G06F30/20
- IPC: G06F30/20

Abstract:
A method for analyzing a process output and a method for creating an equipment parameter model are provided. The method for analyzing the process output includes the following steps: A plurality of process steps are obtained. A processor obtains a step model set including a plurality of first step regression models, each of which represents a relationship between N of the process steps and a process output. The processor calculates a correlation of each of the first step regression models. The processor picks up at least two of the first step regression models to be a plurality of second step regression models whose correlations are ranked at top among the correlations of the first step regression models. The processor updates the step model set by a plurality of third step regression models, each of which represents a relationship between M of the process steps and the process output.
Public/Granted literature
- US20180314773A1 METHOD FOR ANALYZING PROCESS OUTPUT AND METHOD FOR CREATING EQUIPMENT PARAMETER MODEL Public/Granted day:2018-11-01
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