Invention Grant
- Patent Title: Semiconductor package and method of manufacturing the same
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Application No.: US16056532Application Date: 2018-08-07
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Publication No.: US11075150B2Publication Date: 2021-07-27
- Inventor: Li-Hsien Huang , An-Jhih Su , Der-Chyang Yeh , Hua-Wei Tseng , Chiang Lin , Ming-Shih Yeh
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: H01L23/495
- IPC: H01L23/495 ; H01L23/498 ; H01L23/31 ; H01L21/56 ; H01L25/10 ; H01L21/48

Abstract:
A redistribution structure includes a first dielectric layer and a first redistribution circuit layer. The first dielectric layer includes a first via opening. The first redistribution circuit layer is disposed on the first dielectric layer and includes a via portion filling the first via opening and a circuit portion connecting the via portion and extending over the first dielectric layer. A maximum vertical distance between an upper surface of the via portion and an upper surface of the circuit portion is substantially equal to or smaller than 0.5 μm.
Information query
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