- 专利标题： Microparticle measurement device and cleaning method for microparticle measurement device
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申请号： US16305885申请日： 2017-03-07
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公开(公告)号： US11112345B2公开(公告)日： 2021-09-07
- 发明人: Yoshitsugu Sakai , Masaaki Abe , Koichi Tsukihara , Shoji Akiyama , Shinichi Hasegawa
- 申请人： SONY CORPORATION
- 申请人地址： JP Tokyo
- 专利权人： SONY CORPORATION
- 当前专利权人： SONY CORPORATION
- 当前专利权人地址： JP Tokyo
- 代理机构： Chip Law Group
- 优先权： JPJP2016-116693 20160610
- 国际申请： PCT/JP2017/008877 WO 20170307
- 国际公布： WO2017/212718 WO 20171214
- 主分类号： G01N15/14
- IPC分类号： G01N15/14
摘要：
Provided is a microparticle measurement device including a light emission unit that emits light to a microparticle to be analyzed and a light detection unit that detects light generated from the microparticle at a predetermined detection position. The microparticle measurement device further includes an analysis unit that is connected to the light detection unit and analyzes a detection value of the light detected by the light detection unit. The light detection unit is movable from the detection position.
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