Invention Grant
- Patent Title: Functional circuitry, decompressor circuitry, scan circuitry, masking circuitry, qualification circuitry
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Application No.: US16780119Application Date: 2020-02-03
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Publication No.: US11119152B2Publication Date: 2021-09-14
- Inventor: Prakash Narayanan , Rubin A. Parekhji , Arvind Jain , Sundarrajan Subramanian
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Charles F. Koch; Charles A. Brill; Frank D. Cimino
- Priority: IN1625/CHE/2010 20100611
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G01R31/3177 ; G01R31/3185

Abstract:
Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.
Public/Granted literature
- US20200174069A1 COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROCESSES, CIRCUITS, DEVICES AND SYSTEMS Public/Granted day:2020-06-04
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