- 专利标题: Electrical fuse with metal line migration
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申请号: US13234205申请日: 2011-09-16
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公开(公告)号: US11152300B2公开(公告)日: 2021-10-19
- 发明人: Baozhen Li , Yan Zun Li , Keith Kwong Hon Wong , Chih-Chao Yang
- 申请人: Baozhen Li , Yan Zun Li , Keith Kwong Hon Wong , Chih-Chao Yang
- 申请人地址: US VT South Burlington; US NY Lagrangeville; US NY Wappingers Falls; US NY Glenmont
- 专利权人: Baozhen Li,Yan Zun Li,Keith Kwong Hon Wong,Chih-Chao Yang
- 当前专利权人: Baozhen Li,Yan Zun Li,Keith Kwong Hon Wong,Chih-Chao Yang
- 当前专利权人地址: US VT South Burlington; US NY Lagrangeville; US NY Wappingers Falls; US NY Glenmont
- 代理机构: Tutunjian & Bitetto, P.C.
- 代理商 L. Jeffrey Kelly
- 主分类号: H01L23/525
- IPC分类号: H01L23/525 ; H01L21/326
摘要:
An electrical fuse device is disclosed. A circuit apparatus can include the fuse device, a first circuit element and a second circuit element. The fuse includes a first contact that has a first electromigration resistance, a second contact that has a second electromigration resistance and a metal line, which is coupled to the first contact and to the second contact, that has a third electromigration resistance that is lower than the second electromigration resistance. The first circuit element is coupled to the first contact and the second circuit element coupled to the second contact. The fuse is configured to conduct a programming current from the first contact to the second contact through the metal line. Further, the programming current causes the metal line to electromigrate away from the second contact to electrically isolate the second circuit element from the first circuit element.
公开/授权文献
- US20130071998A1 Electrical Fuse With Metal Line Migration 公开/授权日:2013-03-21
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