- Patent Title: Semiconductor layer between source/drain regions and gate spacers
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Application No.: US15983540Application Date: 2018-05-18
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Publication No.: US11152461B2Publication Date: 2021-10-19
- Inventor: Rishabh Mehandru , Anupama Bowonder , Biswajeet Guha , Tahir Ghani , Stephen M. Cea , William Hsu , Szuya S Liao , Pratik A. Patel
- Applicant: INTEL CORPORATION
- Applicant Address: US CA Santa Clara
- Assignee: INTEL CORPORATION
- Current Assignee: INTEL CORPORATION
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L29/78 ; H01L29/66

Abstract:
A semiconductor device is described that includes a first semiconductor layer conformally disposed on at least a portion of a source region and a second semiconductor layer conformally disposed on at least a portion of a drain region between the source/drain regions and corresponding gate spacers. The semiconductor layer can prevent diffusion and/or segregation of dopants from the source and drain regions into the gate spacers of the gate stack. Maintaining the intended location of dopant atoms in the source region and drain region improves the electrical characteristics of the semiconductor device including the external resistance (“Rext”) of the semiconductor device.
Public/Granted literature
- US20190355811A1 SEMICONDUCTOR LAYER BETWEEN SOURCE/DRAIN REGIONS AND GATE SPACERS Public/Granted day:2019-11-21
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