- 专利标题: Systems and methods for X-ray diffraction virtual spectroscopy
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申请号: US16844484申请日: 2020-04-09
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公开(公告)号: US11156568B2公开(公告)日: 2021-10-26
- 发明人: Krzysztof Iniewski , Michael Ayukawa , Conny Hansson
- 申请人: REDLEN TECHNOLOGIES, INC.
- 申请人地址: CA Saanichton
- 专利权人: REDLEN TECHNOLOGIES, INC.
- 当前专利权人: REDLEN TECHNOLOGIES, INC.
- 当前专利权人地址: CA Saanichton
- 代理机构: The Marbury Law Group PLLC
- 主分类号: G01N23/20008
- IPC分类号: G01N23/20008 ; G01N23/207
摘要:
Various aspects include methods and devices for reducing the scanning time for an X-ray diffraction scanner system by increasing the count rate or efficiency of the energy discriminating X-ray detector. In a first embodiment, the count rate of the energy discriminating X-ray detector is increased by increasing the number of detectors counting X-ray scatter photon in particular energy bins by configuring individual pixel detectors within a 2-D X-ray detector array to count photons within specific energy bins. In a second embodiment, the gain of amplifier components in the detector processing circuitry is increased in order to increase the energy resolution of the detector. In a third embodiment, the individual pixel detectors within a 2-D X-ray detector array are configured to count photons within specific energy bins and the gain of amplifier components in the detector processing circuitry is increased in order to increase the energy resolution of the detector.
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