Invention Grant
- Patent Title: Systems and methods for X-ray diffraction virtual spectroscopy
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Application No.: US16844484Application Date: 2020-04-09
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Publication No.: US11156568B2Publication Date: 2021-10-26
- Inventor: Krzysztof Iniewski , Michael Ayukawa , Conny Hansson
- Applicant: REDLEN TECHNOLOGIES, INC.
- Applicant Address: CA Saanichton
- Assignee: REDLEN TECHNOLOGIES, INC.
- Current Assignee: REDLEN TECHNOLOGIES, INC.
- Current Assignee Address: CA Saanichton
- Agency: The Marbury Law Group PLLC
- Main IPC: G01N23/20008
- IPC: G01N23/20008 ; G01N23/207

Abstract:
Various aspects include methods and devices for reducing the scanning time for an X-ray diffraction scanner system by increasing the count rate or efficiency of the energy discriminating X-ray detector. In a first embodiment, the count rate of the energy discriminating X-ray detector is increased by increasing the number of detectors counting X-ray scatter photon in particular energy bins by configuring individual pixel detectors within a 2-D X-ray detector array to count photons within specific energy bins. In a second embodiment, the gain of amplifier components in the detector processing circuitry is increased in order to increase the energy resolution of the detector. In a third embodiment, the individual pixel detectors within a 2-D X-ray detector array are configured to count photons within specific energy bins and the gain of amplifier components in the detector processing circuitry is increased in order to increase the energy resolution of the detector.
Public/Granted literature
- US20200326290A1 SYSTEMS AND METHODS FOR X-RAY DIFFRACTION VIRTUAL SPECTROSCOPY Public/Granted day:2020-10-15
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