Invention Grant
- Patent Title: MEMS probe card assembly having decoupled electrical and mechanical probe connections
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Application No.: US16175341Application Date: 2018-10-30
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Publication No.: US11156640B2Publication Date: 2021-10-26
- Inventor: Mukesh Selvaraj , January Kister
- Applicant: FormFactor, Inc.
- Applicant Address: US CA Livermore
- Assignee: FormFactor, Inc.
- Current Assignee: FormFactor, Inc.
- Current Assignee Address: US CA Livermore
- Agency: Lumen Patent Firm
- Main IPC: G01R1/073
- IPC: G01R1/073 ; G01R1/067 ; G01R3/00

Abstract:
Probes are connected to the space transformer via multiple carrier plates. Electrical contacts from the probes to the space transformer are by way of spring tail features on the probes that connect to the space transformer and not to the carrier plates. In other words, the carrier plates are purely mechanical in function. This configuration can significantly reduce probe array fabrication time relative to sequential placement of individual probes on the space transformer. Multiple probe carrier plates can be populated with probes in parallel, and the final sequential assembly of carrier plates onto the space transformer has a greatly reduced operation count. Deviations of the space transformer from flatness can be compensated for.
Public/Granted literature
- US20190128924A1 MEMS Probe Card Assembly having Decoupled Electrical and Mechanical Probe connections Public/Granted day:2019-05-02
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