- 专利标题: Silicon compounds and methods for depositing films using same
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申请号: US16443978申请日: 2019-06-18
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公开(公告)号: US11158498B2公开(公告)日: 2021-10-26
- 发明人: Robert G. Ridgeway , Jennifer Lynn Anne Achtyl , Raymond N. Vrtis , Xinjian Lei , William Robert Entley
- 申请人: Versum Materials US, LLC
- 申请人地址: US AZ Tempe
- 专利权人: Versum Materials US, LLC
- 当前专利权人: Versum Materials US, LLC
- 当前专利权人地址: US AZ Tempe
- 代理商 David K. Benson
- 主分类号: H01L21/02
- IPC分类号: H01L21/02 ; C23C16/56 ; C23C16/50 ; C07F7/08
摘要:
A chemical vapor deposition method for producing a dielectric film, the method comprising: providing a substrate into a reaction chamber; introducing gaseous reagents into the reaction chamber wherein the gaseous reagents comprise a silicon precursor comprising an silicon compound having Formula I as defined herein and applying energy to the gaseous reagents in the reaction chamber to induce reaction of the gaseous reagents to deposit a film on the substrate. The film as deposited is suitable for its intended use without an optional additional cure step applied to the as-deposited film.
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