Invention Grant
- Patent Title: Measurement device, measurement method, and control program for measurement device
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Application No.: US15936628Application Date: 2018-03-27
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Publication No.: US11181639B2Publication Date: 2021-11-23
- Inventor: Hideki Morita , Ken'ichiro Yoshino , Yasushi Tanaka
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Chiesa Shahinian & Giantomasi PC
- Priority: JPJP2017-069965 20170331
- Main IPC: G01S17/00
- IPC: G01S17/00 ; G01S17/42 ; G01B11/00 ; G01C15/00 ; G01S7/481

Abstract:
Provided is a measurement device or the like that expands a dynamic range easily and promptly as appropriate even when three-dimensional data or the like on some parts of a measurement target object is not acquirable, so that the data can be acquired. A measurement device includes a light source unit that sequentially emits a plurality of beams of distance measurement light to an identical target object, based on predetermined fixed output information, a light reception unit that receives reflected light, from the target object, based on which the measurement device acquires measurement information, and an output value reducing unit and/or an input value reducing unit, the output value reducing unit reducing an output value of the light source unit, the input value reducing unit reducing an input value of the reflected light to the light reception unit.
Public/Granted literature
- US20180284281A1 MEASUREMENT DEVICE, MEASUREMENT METHOD, AND CONTROL PROGRAM FOR MEASUREMENT DEVICE Public/Granted day:2018-10-04
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