Invention Grant
- Patent Title: Systems and methods for deep learning microscopy
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Application No.: US16395674Application Date: 2019-04-26
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Publication No.: US11222415B2Publication Date: 2022-01-11
- Inventor: Aydogan Ozcan , Yair Rivenson , Hongda Wang , Harun Gunaydin , Kevin de Haan
- Applicant: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
- Applicant Address: US CA Oakland
- Assignee: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
- Current Assignee: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
- Current Assignee Address: US CA Oakland
- Agency: Vista IP Law Group LLP
- Main IPC: G06T5/50
- IPC: G06T5/50 ; G06N3/08 ; G06T3/40 ; G06T5/00

Abstract:
A microscopy method includes a trained deep neural network that is executed by software using one or more processors of a computing device, the trained deep neural network trained with a training set of images comprising co-registered pairs of high-resolution microscopy images or image patches of a sample and their corresponding low-resolution microscopy images or image patches of the same sample. A microscopy input image of a sample to be imaged is input to the trained deep neural network which rapidly outputs an output image of the sample, the output image having improved one or more of spatial resolution, depth-of-field, signal-to-noise ratio, and/or image contrast.
Public/Granted literature
- US20190333199A1 SYSTEMS AND METHODS FOR DEEP LEARNING MICROSCOPY Public/Granted day:2019-10-31
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