Invention Grant
- Patent Title: Three-dimensional nonvolatile memory and method of performing read operation in the nonvolatile memory
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Application No.: US17023002Application Date: 2020-09-16
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Publication No.: US11222697B2Publication Date: 2022-01-11
- Inventor: Sang-Wan Nam , Won-Taeck Jung
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Volentine, Whitt & Francos, PLLC
- Priority: KR10-2013-0022313 20130228
- Main IPC: G11C16/06
- IPC: G11C16/06 ; G11C16/04 ; G11C16/34 ; G11C16/10 ; G11C16/26 ; G11C16/08 ; G11C16/24

Abstract:
A nonvolatile memory device performs a read operation comprising first and second intervals. In the first interval the device applies a turn-on voltage to string selection lines and ground selection lines connected to the string selection transistors and the ground selection transistors, respectively. In the second interval, the device applies a turn-off voltage to unselected string selection lines and unselected ground selection lines while continuing to apply the turn-on voltage to a selected string selection line and a selected ground selection line. In both the first and second intervals, the device applies a first read voltage to a selected wordline connected to memory cells to be read by the read operation and applying a second read voltage to unselected wordlines among connected to memory cells not to be read by the read operation.
Information query