- 专利标题: Gateway assisted diagnostics and repair
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申请号: US15389961申请日: 2016-12-23
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公开(公告)号: US11228480B2公开(公告)日: 2022-01-18
- 发明人: Yen Hsiang Chew , Kanapathy Murugayah , Jose Avalos
- 申请人: Intel Corporation
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Schwegman Lundberg & Woessner, P.A.
- 主分类号: H04L12/24
- IPC分类号: H04L12/24 ; H04L12/66 ; H04L29/06
摘要:
System and techniques for gateway assisted diagnostics and repair are described herein. A request for assistance may be received from a client device at a gateway device attached to a local area network (LAN) and a wide area network (WAN). The request for assistance may include an indication of an event experienced by the client device. The request for assistance may be forwarded to a management controller of the gateway device. Instructions may be transmitted to the client device via the LAN for resolving the event experienced by the client device.
公开/授权文献
- US20180183653A1 GATEWAY ASSISTED DIAGNOSTICS AND REPAIR 公开/授权日:2018-06-28
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