Gateway assisted diagnostics and repair

    公开(公告)号:US11228480B2

    公开(公告)日:2022-01-18

    申请号:US15389961

    申请日:2016-12-23

    申请人: Intel Corporation

    IPC分类号: H04L12/24 H04L12/66 H04L29/06

    摘要: System and techniques for gateway assisted diagnostics and repair are described herein. A request for assistance may be received from a client device at a gateway device attached to a local area network (LAN) and a wide area network (WAN). The request for assistance may include an indication of an event experienced by the client device. The request for assistance may be forwarded to a management controller of the gateway device. Instructions may be transmitted to the client device via the LAN for resolving the event experienced by the client device.

    CLOUD ASSISTED MACHINE LEARNING
    2.
    发明申请

    公开(公告)号:US20210117865A1

    公开(公告)日:2021-04-22

    申请号:US17133724

    申请日:2020-12-24

    申请人: Intel Corporation

    发明人: Yen Hsiang Chew

    摘要: A method for training an analytics engine hosted by an edge server device is provided. The method includes determining a classification for data in an analytics engine hosted by an edge server and computing a confidence level for the classification. The confidence level is compared to a threshold. The data is sent to a cloud server if the confidence level is less than the threshold. A reclassification is received from the cloud server and the analytics engine is trained based, at least in part, on the data and the reclassification.

    Integrated circuit structures with extended conductive pathways

    公开(公告)号:US10553515B2

    公开(公告)日:2020-02-04

    申请号:US16086712

    申请日:2016-04-28

    申请人: Intel Corporation

    发明人: Yen Hsiang Chew

    摘要: Integrated circuit (IC) structures with extended conductive pathways, as well as related structures, devices, and methods, are disclosed herein. For example, in some embodiments, an IC structure may include a die having a device side and an opposing back side; a mold compound disposed at the back side; and a conductive pathway extending into the die from the back side and extending into the mold compound from the back side.

    DEPTH SENSOR OPTIMIZATION BASED ON DETECTED DISTANCE

    公开(公告)号:US20190089939A1

    公开(公告)日:2019-03-21

    申请号:US15708020

    申请日:2017-09-18

    申请人: Intel Corporation

    发明人: Yen Hsiang Chew

    IPC分类号: H04N13/02 H04N5/33 G01B11/22

    摘要: Described are mechanisms for depth sensor optimization based on detected distances. The mechanisms may comprise a distance measurement module, which may be operable to measure a physical distance between a 3D camera sensor and a person or object in view of the 3D camera. The mechanisms may also comprise a sensor mode selector module, which may be operable to select a best camera sensor configuration based on a measured distance from a distance-measurement module.