Invention Grant
- Patent Title: Acquiring and displaying multiple waveforms in a test and measurement instrument
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Application No.: US16430911Application Date: 2019-06-04
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Publication No.: US11231444B1Publication Date: 2022-01-25
- Inventor: Gary J. Waldo , Stephen LaFrance
- Applicant: Tektronix, Inc.
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Miller Nash LLP
- Agent Andrew J. Harrington
- Main IPC: G01R13/02
- IPC: G01R13/02 ; G06F3/0481 ; G06F3/0484
Abstract:
A test and measurement instrument, comprising a display and one or more processors configured to display a waveform viewing area, receive a selection of a viewing mode. When an overlay viewing mode is selected, display two or more waveforms overlaid in a single graticule in the waveform viewing area, and when a stacked viewing mode is selected, display a first waveform in a first slice having a first graticule in the waveform viewing area and display a second waveform in a second slice having a second graticule below the first slice in the waveform viewing area.
Information query
