公开(公告)号：USD894024S1

公开(公告)日：2020-08-25

申请号：US29673538

申请日：2018-12-14

Applicant: Tektronix, Inc.

Designer： Brian A. Hollenberg ,  Jessica Anna Dunn ,  Stephen LaFrance ,  Taylor S. K. Heen ,  Jonathan D. Clem ,  Joshua J. O'Brien ,  Preston S. Gabel ,  Marc A. Gessford

公开(公告)号：US11231444B1

公开(公告)日：2022-01-25

申请号：US16430911

申请日：2019-06-04

Applicant: Tektronix, Inc.

Inventor： Gary J. Waldo ,  Stephen LaFrance

IPC: G01R13/02 ,  G06F3/0481 ,  G06F3/0484

Abstract: A test and measurement instrument, comprising a display and one or more processors configured to display a waveform viewing area, receive a selection of a viewing mode. When an overlay viewing mode is selected, display two or more waveforms overlaid in a single graticule in the waveform viewing area, and when a stacked viewing mode is selected, display a first waveform in a first slice having a first graticule in the waveform viewing area and display a second waveform in a second slice having a second graticule below the first slice in the waveform viewing area.

公开(公告)号：USD786107S1

公开(公告)日：2017-05-09

申请号：US29537394

申请日：2015-08-25

Applicant: TEKTRONIX, INC.

Designer： James D. Pileggi ,  Stephen LaFrance