Invention Grant
- Patent Title: Configurable quality metric for positioning measurements
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Application No.: US16900522Application Date: 2020-06-12
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Publication No.: US11240778B2Publication Date: 2022-02-01
- Inventor: Alexandros Manolakos , Guttorm Ringstad Opshaug , Sony Akkarakaran , Arash Mirbagheri , Tao Luo , Peter Gaal
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: QUALCOMM Incorporated
- Priority: GR20190100359 20190814
- Main IPC: H04W64/00
- IPC: H04W64/00 ; G01S5/02 ; H04L5/00 ; H04W24/10

Abstract:
Disclosed are techniques for wireless communication. In an aspect, a network node performs one or more positioning measurements of one or more types of positioning measurements of one or more reference signals, and reports, to a positioning entity, the one or more positioning measurements and one or more measurement quality values representing a measurement quality of the one or more positioning measurements, the one or more measurement quality values based on measurement quality reporting parameters, wherein the measurement quality reporting parameters comprise a minimum error value, a maximum error value, a number of bits used for the one or more measurement quality values, a scaling function or an identifier of the scaling function, or any combination thereof.
Public/Granted literature
- US20210051623A1 CONFIGURABLE QUALITY METRIC FOR POSITIONING MEASUREMENTS Public/Granted day:2021-02-18
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