Invention Grant
- Patent Title: Ranking of objects with noisy measurements
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Application No.: US16557906Application Date: 2019-08-30
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Publication No.: US11244440B2Publication Date: 2022-02-08
- Inventor: Bikram Baidya , Allan Gu , Vivek K. Singh , Abde Ali Hunaid Kagalwalla
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Alliance IP, LLC
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06F7/544

Abstract:
A method includes, for each data object of a plurality of data objects, performing a measurement on a plurality of instances of the data object to generate a plurality of measurement values for the data object, and generating a distribution of the measurement values for the data object. The method further includes generating an aggregate distribution based on each of the distributions of the measurement values generated for the data objects, and scoring a first data object of the plurality of data objects based on the distribution of the measurement values for the first data object and the aggregate distribution.
Public/Granted literature
- US20200005451A1 RANKING OF OBJECTS WITH NOISY MEASUREMENTS Public/Granted day:2020-01-02
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