- 专利标题: Transducer interface pair impedance measurement
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申请号: US16053662申请日: 2018-08-02
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公开(公告)号: US11247232B2公开(公告)日: 2022-02-15
- 发明人: Krishnaswamy Nagaraj , Asif Qaiyum , Baher S. Haroun
- 申请人: Texas Instruments Incorporated
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 代理商 Ebby Abraham; Charles A. Brill; Frank D. Cimino
- 主分类号: B06B1/02
- IPC分类号: B06B1/02 ; G01F1/66 ; H03K17/687
摘要:
In described examples, a first and second driver each include a first-rail output transistor including a first terminal coupled to a first power rail and a second-rail output transistor including a first terminal coupled to a second power rail. The first-rail output transistor of each of the first and second drivers includes a second terminal coupled to a second terminal of the second-rail output transistor of an output node of each respective first and second driver. A resistive load includes a first terminal coupled to the first-driver output node and includes a second terminal coupled to the second-driver output node. A sampling circuit generates an indication of an impedance of at least one of the output transistors of the first and second drivers.
公开/授权文献
- US20190039091A1 TRANSDUCER INTERFACE PAIR IMPEDANCE MEASUREMENT 公开/授权日:2019-02-07
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