Invention Grant
- Patent Title: Ophthalmological device and ophthalmological inspection system
-
Application No.: US16686245Application Date: 2019-11-18
-
Publication No.: US11253148B2Publication Date: 2022-02-22
- Inventor: Takefumi Hayashi , Kouta Fujii
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Xsensus LLP
- Priority: JP2016-019388 20160204
- Main IPC: A61B3/10
- IPC: A61B3/10 ; A61B3/107 ; A61B3/103 ; A61B3/00 ; A61B3/12 ; A61B3/14 ; A61B3/16

Abstract:
An ophthalmological device according to the embodiments comprises an objective lens, a subjective inspection optical system, and an interference optical system. The subjective inspection optical system includes an optical element capable of correcting aberration of a subject's eye and projects a visual target onto the subject's eye via the objective lens and the optical element. The interference optical system splits light from a light source into reference light and measurement light, projects the measurement light onto the subject's eye via the objective lens and the optical element, generates interference light between returning light of the measurement light and the reference light, and detects the generated interference light.
Public/Granted literature
- US20200077888A1 OPHTHALMOLOGICAL DEVICE AND OPHTHALMOLOGICAL INSPECTION SYSTEM Public/Granted day:2020-03-12
Information query