- 专利标题: Self-aligned source and drain contacts
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申请号: US16918755申请日: 2020-07-01
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公开(公告)号: US11264481B2公开(公告)日: 2022-03-01
- 发明人: Chanro Park , Kangguo Cheng , Ruilong Xie , Juntao Li
- 申请人: International Business Machines Corporation
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Michael J. Chang, LLC
- 代理商 Randall Bluestone
- 主分类号: H01L29/66
- IPC分类号: H01L29/66 ; H01L21/285 ; H01L21/768 ; H01L23/532 ; H01L23/535 ; H01L29/45 ; H01L29/78
摘要:
Self-aligned semiconductor FET device source and drain contacts and techniques for formation thereof are provided. In one aspect, a semiconductor FET device includes: at least one gate disposed on a substrate; source and drains on opposite sides of the at least one gate; gate spacers offsetting the at least one gate from the source and drains; lower source and drain contacts disposed on the source and drains; upper source and drain contacts disposed on the lower source and drain contacts; and a silicide present between the lower source and drain contacts and the upper source and drain contacts.
公开/授权文献
- US20220005934A1 Self-Aligned Source and Drain Contacts 公开/授权日:2022-01-06
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