- 专利标题: Magnetic field measuring device
-
申请号: US16614884申请日: 2018-03-30
-
公开(公告)号: US11275128B2公开(公告)日: 2022-03-15
- 发明人: Keiji Tsukada
- 申请人: NATIONAL UNIVERSITY CORPORATION OKAYAMA UNIVERSITY
- 申请人地址: JP Okayama
- 专利权人: NATIONAL UNIVERSITY CORPORATION OKAYAMA UNIVERSITY
- 当前专利权人: NATIONAL UNIVERSITY CORPORATION OKAYAMA UNIVERSITY
- 当前专利权人地址: JP Okayama
- 代理机构: Cantor Colburn LLP
- 优先权: JPJP2017-100227 20170519
- 国际申请: PCT/JP2018/013670 WO 20180330
- 国际公布: WO2018/211833 WO 20181122
- 主分类号: G01R33/035
- IPC分类号: G01R33/035 ; G01R33/00 ; G01R33/06 ; G01R33/07 ; G01R33/09
摘要:
Provided is a magnetic field measuring device which has good temperature stability and which enables an improvement by making it possible for the sensitivity of a Hall element, a magnetic impedance (MI) element or a magnetic resistance (MR) element, which are conventionally used extensively, to be set freely. This magnetic field measuring device comprises: a temperature maintaining means for maintaining an extremely low temperature state in which a superconductor adopts a superconducting state; a magnetic sensor which is provided inside the temperature maintaining means to detect a magnetic field; and a magnetic field space forming means for forming a magnetic field space specific to the superconducting state, by adopting a superconducting state inside the temperature maintaining means; wherein the magnetic sensor is disposed in the magnetic field space.
信息查询