Invention Grant
- Patent Title: Device for electromagnetic structural characterization
-
Application No.: US15823735Application Date: 2017-11-28
-
Publication No.: US11293963B2Publication Date: 2022-04-05
- Inventor: Anthony Kerselaers , Axel Nackaerts
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Main IPC: A61B5/05
- IPC: A61B5/05 ; A61B5/053 ; A61B5/02 ; A61B5/00 ; A61B5/08 ; A61B5/0205 ; G01R29/08 ; G01N27/72 ; H04B5/00 ; G01N27/02

Abstract:
One example discloses a device for electromagnetic structural characterization, including: a controller having an electromagnetic transmitter output and a communications interface; wherein the controller is configured to send a signal over the electromagnetic transmitter output that causes an electromagnetic transmitter to generate a first electrical field (E1) and a first magnetic field (H1); wherein the controller configured to receive over the communications interface a second electric field (E2) and a second magnetic field (H2) received by an electromagnetic receiver; wherein the first electrical field and the first magnetic field correspond to when the electromagnetic transmitter is at a first location proximate to a structure and the second electrical field and the second magnetic field correspond to when the electromagnetic receiver is at a second location proximate to the structure; and wherein the controller is configured to calculate an impedance based on the electric and magnetic fields interacting with the structure.
Public/Granted literature
- US20190162766A1 DEVICE FOR ELECTROMAGNETIC STRUCTURAL CHARACTERIZATION Public/Granted day:2019-05-30
Information query