Invention Grant
- Patent Title: Input/output capacitance measurement, and related methods, devices, and systems
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Application No.: US16927535Application Date: 2020-07-13
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Publication No.: US11302387B2Publication Date: 2022-04-12
- Inventor: Hyunui Lee
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: TraskBritt
- Main IPC: H03K19/0185
- IPC: H03K19/0185 ; H03K3/00 ; H03K3/356 ; G11C11/4096 ; H03K5/24 ; G01R27/26 ; G11C11/4076 ; H03K3/037

Abstract:
A device may include a current source configured to couple a charged node to a ground voltage to generate a current. The device may include a second circuit coupled to the node and configured to compare, beginning during a first clock cycle of a clock signal and for each clock cycle of a number of clock cycles of the clock signal, the voltage at the node to a reference voltage to generate a result. The device may further include a control unit configured to: detect, upon completion of a subsequent clock cycle of the clock signal, a change in the result; determine, in response to the change in the result, a transition time based on a number of elapsed clock cycles from the first clock cycle to completion of the subsequent clock cycle; and determine a capacitance of the node based on the transition time. Related systems and methods are also described.
Public/Granted literature
- US20220013164A1 INPUT/OUTPUT CAPACITANCE MEASUREMENT, AND RELATED METHODS, DEVICES, AND SYSTEMS Public/Granted day:2022-01-13
Information query
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