Invention Grant
- Patent Title: Strain gauge pattern to prevent variation due to temperature
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Application No.: US16887352Application Date: 2020-05-29
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Publication No.: US11353373B2Publication Date: 2022-06-07
- Inventor: Min Sang Kim , Chan Hyuck Yun , Sa Hyang Hong , Ju Hyun Son
- Applicant: STMicroelectronics Asia Pacific Pte Ltd
- Applicant Address: SG Singapore
- Assignee: STMicroelectronics Asia Pacific Pte Ltd
- Current Assignee: STMicroelectronics Asia Pacific Pte Ltd
- Current Assignee Address: SG Singapore
- Agency: Crowe & Dunlevy
- Main IPC: G01L1/00
- IPC: G01L1/00 ; G01L1/22

Abstract:
A strain gauge includes first and second substrates spaced apart from one another. A first flexible printed circuit board portion is in contact with a top side of the first and second substrates, and has a first Wheatstone bridge formed therein. The first flexible printed circuit board portion positions the first Wheatstone bridge such that two resistors of the first Wheatstone bridge are positioned to span from the top side of the first substrate to the top side of the second substrate. A second flexible printed circuit board portion is in contact with a bottom side of the first and second substrates, and has a second Wheatstone bridge formed therein. The second flexible printed circuit board positions the second Wheatstone bridge such that two resistors of the second Wheatstone bridge are positioned to span from the bottom side of the first substrate to the bottom side of the second substrate.
Public/Granted literature
- US20210372867A1 STRAIN GAUGE PATTERN TO PREVENT VARIATION DUE TO TEMPERATURE Public/Granted day:2021-12-02
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