An inspection device includes: an illumination device that irradiates an object with near infrared light; a spectroscope that disperses reflected light from the object irradiated with the near infrared light; an imaging device that takes a spectroscopic image of the reflected light dispersed by the spectroscope; and a processor. The processor: obtains spectral data at a plurality of points on the object based on the spectroscopic image obtained by the imaging device; selects, as typical spectral data representing the object from among the spectral data at the plurality of points, one of: spectral data in which a luminance value in a predetermined wavelength is a median value; and spectral data in which a summation of luminance values in a predetermined wavelength range is a median value; and performs a predetermined analysis for the object based on the typical spectral data and detects a different type of object.