Invention Grant
- Patent Title: Device with sample temperature adjustment function
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Application No.: US17059667Application Date: 2018-06-18
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Publication No.: US11378496B2Publication Date: 2022-07-05
- Inventor: Koki Miyazaki , Shinji Tanaka
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Renner, Otto, Boisselle & Sklar, LLP
- International Application: PCT/JP2018/023088 WO 20180618
- International Announcement: WO2019/244198 WO 20191226
- Main IPC: G01N1/28
- IPC: G01N1/28 ; G01N30/06 ; G01N30/24 ; G01N30/02

Abstract:
A device includes a sample rack having a mounting region for mounting a sample plate that holds a sample, a housing in which a temperature adjustment space for adjusting a temperature of the sample plate mounted on the sample rack while accommodating the sample rack inside is provided therein, and the housing having, in a lateral surface, a rack insertion opening through which the sample rack is inserted into the temperature adjustment space; and an air temperature adjustment part having an air intake port for taking in air in the temperature adjustment space, a temperature adjustment element for cooling or heating air taken in from the air intake portion, and an outlet for blowing out air cooled or heated by the temperature adjustment element.
Public/Granted literature
- US20210208034A1 DEVICE WITH SAMPLE TEMPERATURE ADJUSTMENT FUNCTION Public/Granted day:2021-07-08
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