Invention Grant
- Patent Title: Apparatus for prediction of failure of a functional circuit
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Application No.: US16176372Application Date: 2018-10-31
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Publication No.: US11378617B2Publication Date: 2022-07-05
- Inventor: Michael Doescher , Jan-Peter Schat
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP17208592 20171219
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/30

Abstract:
An apparatus comprising: a functional circuit comprising one or more circuit components configured to perform a function based on one or more first input signals; at least one failure-prediction circuit for use in predicting failure of the functional circuit, the failure-prediction circuit comprising a replica of the functional circuit in terms of constituent circuit components; wherein the failure-prediction circuit is configured to be more susceptible to failure than said functional circuit, wherein the apparatus is configured to provide a prediction of failure of the functional circuit based on a determination of failure of the failure-prediction circuit.
Public/Granted literature
- US20190187204A1 APPARATUS FOR PREDICTION OF FAILURE OF A FUNCTIONAL CIRCUIT Public/Granted day:2019-06-20
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