• Patent Title: Apparatus for prediction of failure of a functional circuit
  • Application No.: US16176372
    Application Date: 2018-10-31
  • Publication No.: US11378617B2
    Publication Date: 2022-07-05
  • Inventor: Michael DoescherJan-Peter Schat
  • Applicant: NXP B.V.
  • Applicant Address: NL Eindhoven
  • Assignee: NXP B.V.
  • Current Assignee: NXP B.V.
  • Current Assignee Address: NL Eindhoven
  • Priority: EP17208592 20171219
  • Main IPC: G01R31/28
  • IPC: G01R31/28 G01R31/30
Apparatus for prediction of failure of a functional circuit
Abstract:
An apparatus comprising: a functional circuit comprising one or more circuit components configured to perform a function based on one or more first input signals; at least one failure-prediction circuit for use in predicting failure of the functional circuit, the failure-prediction circuit comprising a replica of the functional circuit in terms of constituent circuit components; wherein the failure-prediction circuit is configured to be more susceptible to failure than said functional circuit, wherein the apparatus is configured to provide a prediction of failure of the functional circuit based on a determination of failure of the failure-prediction circuit.
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