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公开(公告)号：US11842934B2
公开(公告)日：2023-12-12
申请号：US16527296
申请日：2019-07-31
Applicant: NXP B.V.
Inventor： Jan-Peter Schat
CPC classification number: H01L22/34 , G01R31/2856 , G01R31/2865 , G06F21/76 , H01L23/57
Abstract: A mechanism is provided to secure integrated circuit devices that combines a high degree of security with a low overhead, both in area and cost, thereby making it appropriate for smaller, cheaper integrated circuits. A determination is made whether a device die is on a wafer or if the device die is incorporated into a package. Only if the device die is incorporated in a package can the functional logic of device die be activated, and then only if a challenge-response query is satisfied. In some embodiments, a random number generator is used during wafer testing to form a pair of numbers, along with a die identifier, that is unique for each device die. A final test is then performed in which the device die can be activated if the device die is incorporated in a package, and the die identifier—random number pair is authenticated.
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公开(公告)号：US11689932B2
公开(公告)日：2023-06-27
申请号：US17028188
申请日：2020-09-22
Applicant: NXP B.V.
Inventor： Jan-Peter Schat
IPC: H04W12/12 , H04W12/122 , H04W12/63 , H04B7/06 , H04W84/12
CPC classification number: H04W12/122 , H04B7/0626 , H04W12/63 , H04W84/12
Abstract: A wireless communication device is described that comprises: a receiver configured to receive wireless local area signals located within a closed area; and a processor configured to: process the received wireless local area signals; calculate a standard deviation, STD, of Amplitude Channel State Information, A CSI, of the received wireless local area signals and, in response thereto, generate at least one transmit wireless local area signal based on the calculated A CSI STD values. A transmitter is coupled to the processor and configured to transmit the at least one transmit wireless local area signal within the closed area to disrupt an attacker located adjacent the closed area from determining a location or movement of at least one of: a moving person, the at least one further wireless communication device within the closed area.
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公开(公告)号：US20220140867A1
公开(公告)日：2022-05-05
申请号：US17449759
申请日：2021-10-01
Applicant: NXP B.V.
Inventor： Jan-Peter Schat
IPC: H04B7/0452 , H04B7/06
Abstract: A communications system (300) comprising: an antenna (320) that comprises a plurality of serially connected sub-antenna elements (322); and a signal generator (324) configured to provide a transmission signal to the antenna (320) for propagating along the sub-antenna elements (322). The transmission signal comprises a plurality of serial symbol packets. The signal generator (324) is configured to set the phase of the serial symbol packets such that when they align with predefined ones of the sub-antenna elements (322) the antenna (322) provides a beamformed signal.
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4.发明申请公开(公告)号：US20210265986A1
公开(公告)日：2021-08-26
申请号：US16799053
申请日：2020-02-24
Applicant: NXP B.V.
Inventor： Jan-Peter Schat
IPC: H03K3/037
Abstract: One specific example involves an integrated circuit that has application logic circuitry which includes flip-flop circuits susceptible to degradations of setup and hold times relative to specified minimum setup and hold times for signals to be processed by the respective flip-flop circuits. In a method carried out by the integrated circuit, timing-based logic states of the flip-flop circuits are controlled, based on at least one transition-scan pattern processed by the flip-flop circuits as part of the application logic circuitry; and respective logic states are set for those flip-flops, which due to degradations of the actual setup and hold times do not satisfy anymore the originally specified minimum setup and hold times.
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公开(公告)号：US20210239754A1
公开(公告)日：2021-08-05
申请号：US17118828
申请日：2020-12-11
Applicant: NXP B.V.
Inventor： Jan-Peter Schat , Abdellatif Zanati , Henrik Asendorf , Maristella Spella , Waqas Hassan Syed , Giorgio Carluccio , Antonius Johannes Matheus de Graauw
IPC: G01R31/311
Abstract: A method of testing a semiconductor device. An apparatus comprising a semiconductor device and a test apparatus. The semiconductor device includes an integrated circuit and a plurality of external radiating elements at a surface of the device, the radiating elements include transmit elements and receive elements. The test apparatus includes a surface for placing against the surface of the device. The test apparatus also includes at least one waveguide, which extends through the test apparatus for routing electromagnetic radiation transmitted by one of the transmit elements of the device to one of the receive elements of the device. Each waveguide comprises a plurality of waveguide openings for coupling electromagnetically to corresponding radiating elements of the plurality of radiating elements located at the surface of the device. A spacing between the waveguide openings of each waveguide is larger than, or smaller than a spacing between the corresponding radiating elements.
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Patent Agency Ranking
公开(公告)号：US20200150704A1
公开(公告)日：2020-05-14
申请号：US16591739
申请日：2019-10-03
Applicant: NXP B.V.
Inventor： Jan-Peter Schat
Abstract: The disclosure relates to voltage regulators and more specially voltage regulators including error detection and correction mechanisms. Example embodiments include a voltage regulator comprising: an input arranged to receive a trim signal used to specify a target voltage at an output of the regulator; a comparator arranged to compare a voltage derived from the trim signal to the voltage at the output of the regulator; a filter arranged to filter an output of the comparator; a checksum module comprising first and second portions arranged to calculate first and second checksums respectively from a plurality of states associated with the voltage regulator and to provide an error signal equal to the difference between the first and second checksums; and an adjustment module arranged to receive the error signal and adjust one or more of the plurality of states if the error signal is non-zero.
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公开(公告)号：US10648889B2
公开(公告)日：2020-05-12
申请号：US15967376
申请日：2018-04-30
Applicant: NXP B.V.
Inventor： Jan-Peter Schat
IPC: G01M15/04 , G01M17/007 , G01M13/00 , G01M15/02
Abstract: A method for detecting defeat devices in an engine control unit (ECU) includes storing with a key-data collection unit, a first key-data determined during an environmental test of a vehicle. The key-data collection unit stores a second key-data determined before the environmental test. Wherein, one of the first key-data is determined by the ECU modified by a characteristic only present before the environmental test and the second key-data is determined by the ECU modified by a characteristic only present during the environmental test. An environmental testing device compares the first key-data with the second key-data to detect an anomaly, wherein the anomaly indicates the presence of the defeat device in the ECU.
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公开(公告)号：US10565156B1
公开(公告)日：2020-02-18
申请号：US16191936
申请日：2018-11-15
Applicant: NXP B.V.
Inventor： Jan-Peter Schat
IPC: G06F13/42 , G06F13/40 , G06F11/14 , H04L25/493 , H03M5/04
Abstract: Embodiments are directed to apparatuses and methods involving communication between a first circuit and a second circuit over a wired-data bus. An example apparatus includes an integrated circuit (IC) chip within one of the first and second circuits and a logic circuit. The IC has a first data-communication port and a second data-communication for connection to respective first and second conductors of the wired-data bus. The logic circuit communicates a code multi-bit word out of a set of code multi-bit words over the wired-data bus by using signal transitions communicated on the first and second conductors. The code multi-bit word conveys clocked data bits indicated by the signal transitions, and information unique relative to other ones of the set of code multi-bit words by a known sequential pattern of the signal transitions defined relative to timing associated with the clocked data bits.
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公开(公告)号：US10097287B1
公开(公告)日：2018-10-09
申请号：US15697776
申请日：2017-09-07
Applicant: NXP B.V.
Inventor： Jan-Peter Schat , Abdellatif Zanati
Abstract: Embodiments are provided for a radar device and a method of operating a radar device, the radar device having a transmitter and a receiver, the method including: generating a chirp signal based on a local oscillator (LO) signal, wherein the LO signal is a frequency-modulated continuous-wave (FMCW) signal; secondary modulating the chirp signal to produce an output signal; transmitting the output signal on a transmitting antenna of the radar device; receiving an echo signal on a receiving antenna of the radar device; downmixing an amplified version of the echo signal with the LO signal to produce a low frequency signal; and outputting an error detection signal based on spectral components of the low frequency signal, wherein the spectral components correspond to the secondary modulating.
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公开(公告)号：US12063045B2
公开(公告)日：2024-08-13
申请号：US17451567
申请日：2021-10-20
Applicant: NXP B.V.
Inventor： Ulrich Moehlmann , Jan-Peter Schat , Tim Lauber
CPC classification number: H03L7/0991 , H03L7/093
Abstract: The disclosure relates to monitoring of feedback systems such as phase lock loops. A system is disclosed, comprising: a feedback circuit (100); and a monitoring module (190). The monitoring module (190) is configured to: i) receive actual values of at least one state variable describing the state of the feedback circuit at a first time; ii) determine a predicted future value of the at least one state variable at a second time from the actual values at the first time using a model of the feedback circuit; iii) receive actual values of the at least one state variable at the second time; iv) compare the predicted future value of the at least one state variable at the second time with the actual value of the at least one state variable at the second time; and v) determine whether the feedback circuit has a fault condition, depending on the results of step iv).
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