Invention Grant
- Patent Title: Digital measurement circuit and memory system using the same
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Application No.: US16989074Application Date: 2020-08-10
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Publication No.: US11381231B2Publication Date: 2022-07-05
- Inventor: Kwan Yeob Chae , Jong-Ryun Choi
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2017-0176956 20171221
- Main IPC: H03K5/156
- IPC: H03K5/156 ; H03K5/133 ; G01R31/317 ; H03K5/135

Abstract:
A digital measurement circuit includes a first input flip-flop which receives a first signal through a data input terminal, receives a first clock signal through a clock input terminal, and outputs a second signal; a second input flip-flop which receives the second signal through a data input terminal, receives a second clock signal, which is an inverted signal of the first clock signal, through a clock input terminal, and outputs a third signal; and a delay line which receives the second signal and outputs first through n-th output signals, wherein n is an integer greater than one, and the first through n-th output signals are sampled based on the third signal to output first through n-th sampling signals is provided.
Public/Granted literature
- US20200373919A1 DIGITAL MEASUREMENT CIRCUIT AND MEMORY SYSTEM USING THE SAME Public/Granted day:2020-11-26
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