Invention Grant
- Patent Title: Millimeter wave material test system
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Application No.: US16892071Application Date: 2020-06-03
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Publication No.: US11385272B2Publication Date: 2022-07-12
- Inventor: Alexander Krauska
- Applicant: Tektronix, Inc.
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Miller Nash LLP
- Agent Andrew J. Harrington
- Main IPC: G01R27/28
- IPC: G01R27/28 ; G01R29/08 ; G01R31/00 ; G01R29/10

Abstract:
A test and measurement device measures an insertion loss of a material under test. The test and measurement device includes a reference device in contact with a first surface of a material under test, the reference device including a reflective component and an absorbing component. A testing device is in contact with a second surface of the material under test, opposite the first surface. The testing device includes a first transmitter to output a first signal at a predetermined frequency to the reflective component of the reference device through the material under test, a first receiver to receive a first reflected signal from the reflective component, a second transmitter output a second signal at the predetermined frequency to the absorbing component of the reference device through the material under test, and a second receiver to receive a second reflected signal from the material under test.
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