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公开(公告)号：US20240137066A1
公开(公告)日：2024-04-25
申请号：US18483470
申请日：2023-10-09
Applicant: Tektronix, Inc.
Inventor： Alexander Krauska
IPC: H04B1/7163
CPC classification number: H04B1/71632
Abstract: A waveform generator includes a carrier band generator to produce a carrier signal, one or more selectable frequency multipliers to receive the carrier signal and to output a selected carrier signal having a frequency of a multiple of the carrier signal, at least two main digital-to-analog converters (DACs), each main DAC to receive a digital in-phase (I) or quadrature (Q) signals, and to convert the digital I and Q signals to analog I and Q signals in accordance with a control signal, at least two offset DACs, each offset DAC to receive the digital I or Q signals to convert the digital I and Q signals to analog I and Q signals in accordance with the control signal, a mixer to mix the analog I and Q signals with the selected carrier signal to produce an output signal, and a variable filter configured to produce a filtered output signal.
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公开(公告)号：US11619657B2
公开(公告)日：2023-04-04
申请号：US17099701
申请日：2020-11-16
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Josiah A. Bartlett , Amr Haj-Omar , Donald J. Dalebroux , Barton T. Hickman , Alexander Krauska
Abstract: An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range. A test and measurement system has a test and measurement instrument having an operating bandwidth, and an accessory device. The accessory device has a first instrument port to connect the accessory device to the test and measurement instrument, a test port to connect the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port to down-convert a signal from the test port having a first frequency range to a signal having a second frequency range lower than the first frequency range.
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公开(公告)号：US11385272B2
公开(公告)日：2022-07-12
申请号：US16892071
申请日：2020-06-03
Applicant: Tektronix, Inc.
Inventor： Alexander Krauska
Abstract: A test and measurement device measures an insertion loss of a material under test. The test and measurement device includes a reference device in contact with a first surface of a material under test, the reference device including a reflective component and an absorbing component. A testing device is in contact with a second surface of the material under test, opposite the first surface. The testing device includes a first transmitter to output a first signal at a predetermined frequency to the reflective component of the reference device through the material under test, a first receiver to receive a first reflected signal from the reflective component, a second transmitter output a second signal at the predetermined frequency to the absorbing component of the reference device through the material under test, and a second receiver to receive a second reflected signal from the material under test.
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4.发明申请SYNCHRONIZATION OF UNSTABLE SIGNAL SOURCES FOR USE IN A PHASE STABLE INSTRUMENT 审中-公开不稳定信号源的同步用于相位稳定仪器公开(公告)号：US20170045603A1
公开(公告)日：2017-02-16
申请号：US14827146
申请日：2015-08-14
Applicant: Tektronix, Inc.
Inventor： Alexander Krauska
CPC classification number: G01R35/005 , G01R27/28 , H04L7/0331
Abstract: A vector network analyzer (VNA) can include a control processor, a plurality of receivers coupled with the control processor, the plurality of receivers having a common signal generator source, and a coupler/power divider network configured to distribute each of a plurality of source reference signals to a corresponding one of the plurality of receivers.
Abstract translation: 矢量网络分析器（VNA）可以包括控制处理器，与控制处理器耦合的多个接收器，所述多个接收器具有公共信号发生器源，以及耦合器/功率分配器网络，被配置为分配多个源 参考信号到所述多个接收器中的对应的一个。
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公开(公告)号：US11946994B2
公开(公告)日：2024-04-02
申请号：US17548381
申请日：2021-12-10
Applicant: Tektronix, Inc.
Inventor： Alexander Krauska
CPC classification number: G01R35/005 , G01R27/28 , H04L7/0331
Abstract: A vector network analyzer (VNA) can include a control processor, a receiver coupled with the control processor, switching circuitry coupled with the receiver, a radio frequency (RF) bridge coupled with the switching circuitry, a transmission line coupled with the RF bridge, wherein the transmission line is configured to be coupled with a load; and a signal generator coupled with the RF bridge.
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Patent Agency Ranking
公开(公告)号：US20210148951A1
公开(公告)日：2021-05-20
申请号：US17099701
申请日：2020-11-16
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Josiah A. Bartlett , Amr Haj-Omar , Donald J. Dalebroux , Barton T. Hickman , Alexander Krauska
Abstract: An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range. A test and measurement system has a test and measurement instrument having an operating bandwidth, and an accessory device. The accessory device has a first instrument port to connect the accessory device to the test and measurement instrument, a test port to connect the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port to down-convert a signal from the test port having a first frequency range to a signal having a second frequency range lower than the first frequency range.
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7.发明公开公开(公告)号：US20240364432A1
公开(公告)日：2024-10-31
申请号：US18643943
申请日：2024-04-23
Applicant: Tektronix, Inc.
Inventor： Christopher N. White , Alexander Krauska , Alejandro C. Buritica
CPC classification number: H04B17/0085 , H04B17/101 , H04B17/191
Abstract: A test and measurement device includes a signal generator to generate a test signal, a signal analyzer to receive a response signal from an adaptive system under test (SUT), communications ports to allow reception of the response signal, and one or more processors to send a signal to the signal generator to generate a first test signal, receive a response signal from the signal analyzer, measure performance of the response signal, and report the performance to at least one of the SUT and a user workspace on the test and measurement device. A method of testing a system under test (SUT) includes generating and sending a test signal with a signal generator, receiving a response signal from the SUT at a signal analyzer, measuring performance of the response signal with respect to the test signal, and reporting the performance to at least one of the SUT and a user workspace.
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8.发明公开公开(公告)号：US20240223200A1
公开(公告)日：2024-07-04
申请号：US18610198
申请日：2024-03-19
Applicant: Tektronix, Inc.
Inventor： Alexander Krauska
CPC classification number: H03M1/1014 , G01R13/0218 , G01R23/16
Abstract: A composite analog-to-digital converter (ADC) has a low resolution ADC configured to receive and digitize analog data, the low resolution ADC having a low resolution and a high operating speed, one or more high resolution ADCs configured to receive and digitize the analog data, the one or more high resolution ADCs having a resolution higher than the low resolution ADC, and an operating speed lower than the high operating speed of the low resolution ADC, a sample clock generator to provide a sample clock signal to the low resolution ADC and to a clock divider, a mixer to receive the analog data and connected to the one or more high resolution ADCs, a local oscillator connected to the mixer to allow one or more high resolution ADCs to be tuned to sample a portion of a spectrum of the low resolution ADC. A test and measurement instrument contains a composite ADC. A method of operating a composite analog-to-digital converter (ADC), includes receiving an analog signal at a low resolution ADC that operates at a high speed, receiving the analog signal at one or more high resolution ADCs that operate at a resolution higher than the low resolution ADC and at a lower speed than the operating speed of the low resolution ADC, tuning the high resolution ADC to phase align and time align a signal path for the one or more high resolution ADCs to the signal path for the low resolution ADC, producing a spectrum from the low resolution ADC, and producing a portion of the spectrum from the one or more high resolution ADCs.
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公开(公告)号：US11936397B2
公开(公告)日：2024-03-19
申请号：US17863304
申请日：2022-07-12
Applicant: TEKTRONIX, INC.
Inventor： Alexander Krauska
CPC classification number: H03M1/1014 , G01R13/0218 , G01R23/16
Abstract: A composite analog-to-digital converter (ADC) has a low resolution ADC configured to receive and digitize analog data, the low resolution ADC having a low resolution and a high operating speed, one or more high resolution ADCs configured to receive and digitize the analog data, the one or more high resolution ADCs having a resolution higher than the low resolution ADC, and an operating speed lower than the high operating speed of the low resolution ADC, a sample clock generator to provide a sample clock signal to the low resolution ADC and to a clock divider, a mixer to receive the analog data and connected to the one or more high resolution ADCs, a local oscillator connected to the mixer to allow the one or more high resolution ADCs to be tuned to sample a portion of a spectrum of the first ADC. A test and measurement instrument contains a composite ADC. A method of operating a composite analog-to-digital converter (ADC), includes receiving an analog signal at a low resolution ADC that operates at a high speed, receiving the analog signal at one or more high resolution ADCs that operate at a resolution higher than the low resolution ADC and at a lower speed than the operating speed of the low resolution ADC, tuning the high resolution ADC to phase align and time align a signal path for the one or more high resolution ADCs to the signal path for the low resolution ADC, producing a spectrum from the low resolution ADC, and producing a portion of the spectrum from the one or more high resolution ADCs.
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公开(公告)号：US20240027507A1
公开(公告)日：2024-01-25
申请号：US18354584
申请日：2023-07-18
Applicant: Tektronix, Inc.
Inventor： Donald J. Dalebroux , Alexander Krauska , Maria Agoston , Alejandro C. Buritica
Abstract: A test and measurement instrument has an arbitrary waveform generator having at least two waveform generators. Each waveform generator includes a signal generator to generate in-phase (I) and quadrature (Q) digital signals according to a selected signal type for a digital constituent output signal, a pulse envelope sequencer to modulate amplitude of the I and Q digital signals, and one or more multipliers to combine the I and Q digital signals with a carrier signal to produce the digital constituent output signal. The arbitrary waveform generator includes a stream manager to produce modulation descriptor words for the waveform generators, a summing block to selectively combine digital constituent output signals to produce a digital multi-constituent output signal, a digital-to-analog converter to convert the digital multi-constituent output signal to an analog output signal, and an internal signal analyzer to receive an analyzer input of one of more of the digital output signals.
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