- 专利标题: Semiconductor structure, transistor including the same, and method of manufacturing transistor
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申请号: US15931969申请日: 2020-05-14
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公开(公告)号: US11387358B2公开(公告)日: 2022-07-12
- 发明人: Younghwan Park , Jongseob Kim
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: KR10-2019-0149111 20191119
- 主分类号: H01L29/778
- IPC分类号: H01L29/778 ; H01L29/06 ; H01L29/20 ; H01L29/205 ; H01L29/66 ; H01L29/78
摘要:
A semiconductor structure includes a substrate; at least one mask layer spaced apart from the substrate in a first direction; a first semiconductor region of a first conductivity type between the substrate and the at least one mask layer; a second semiconductor region of a second conductivity type on the at least one mask layer; and a third semiconductor region of the first conductivity type on the first semiconductor region. The third semiconductor region may contact the second semiconductor region to form a PN-junction structure in a second direction different from the first direction. The semiconductor structure may be applied to vertical power devices and may be capable of increasing withstand voltage performance and lowering an on-resistance.
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