- 专利标题: Magnetic sensor and inspection device
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申请号: US17399345申请日: 2021-08-11
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公开(公告)号: US11432751B2公开(公告)日: 2022-09-06
- 发明人: Satoshi Shirotori , Hitoshi Iwasaki , Akira Kikitsu , Yoshihiro Higashi , Yoshinari Kurosaki
- 申请人: KABUSHIKI KAISHA TOSHIBA
- 申请人地址: JP Tokyo
- 专利权人: KABUSHIKI KAISHA TOSHIBA
- 当前专利权人: KABUSHIKI KAISHA TOSHIBA
- 当前专利权人地址: JP Tokyo
- 代理机构: Finnegan, Henderson, Farabow, Garrett & Dunner L.L.P.
- 优先权: JPJP2020-201001 20201203
- 主分类号: G01R5/00
- IPC分类号: G01R5/00 ; A61B5/245 ; G01R33/00
摘要:
According to one embodiment, a magnetic sensor includes a first magnetic element, a second magnetic element, a third magnetic element located between the first and second magnetic elements in a first direction, a fourth magnetic element located between the third and second magnetic elements in the first direction, a first conductive member, a second conductive member, a third conductive member located between the first and second conductive members in the first direction, a fourth conductive member located between the third and second conductive members in the first direction, a first magnetic member, a second magnetic member, a third magnetic member located between the first and second magnetic members in the first direction, a fourth magnetic member located between the third and second magnetic members in the first direction, and a fifth magnetic member located between the third and fourth magnetic members in the first direction.
公开/授权文献
- US20220175289A1 MAGNETIC SENSOR AND INSPECTION DEVICE 公开/授权日:2022-06-09
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