• Patent Title: Measurement technique for refractive index inhomogeneity between plates of a lightguide optical element (LOE)
  • Application No.: US17044390
    Application Date: 2019-06-20
  • Publication No.: US11454590B2
    Publication Date: 2022-09-27
  • Inventor: Jonathan GelbergYuval RubinMichael Adel
  • Applicant: Lumus Ltd.
  • Applicant Address: IL Ness Ziona
  • Assignee: Lumus Ltd.
  • Current Assignee: Lumus Ltd.
  • Current Assignee Address: IL Ness Ziona
  • Agent Mark M. Friedman
  • International Application: PCT/IB2019/055207 WO 20190620
  • International Announcement: WO2019/244093 WO 20191226
  • Main IPC: G01N21/45
  • IPC: G01N21/45 G01J9/02 G01M11/02 G01M11/00
Measurement technique for refractive index inhomogeneity between plates of a lightguide optical element (LOE)
Abstract:
A system and method for measuring refractive index inhomogeneity between plates of a Lightguide Optical Element (LOE) uses an innovative measuring technique based on a shearing interferometric technique conventionally used to observe interference and test the collimation of light beams. Another feature of the current implementation is an innovative method for analyzing the characteristics of the generated interferogram to characterize discrepancies between adjacent plates in an LOE.
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