Invention Grant
- Patent Title: Gate interface engineering with doped layer
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Application No.: US17348081Application Date: 2021-06-15
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Publication No.: US11456178B2Publication Date: 2022-09-27
- Inventor: Steven C. H. Hung , Benjamin Colombeau , Abhishek Dube , Sheng-Chin Kung , Patricia M. Liu , Malcolm J. Bevan , Johanes F. Swenberg
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: H01L21/28
- IPC: H01L21/28 ; H01L21/02 ; H01L21/321 ; H01L21/8234

Abstract:
Processing methods may be performed to produce semiconductor structures. The methods may include forming a silicon layer over a semiconductor substrate. The forming may include forming a silicon layer incorporating a dopant. The methods may include oxidizing a portion of the silicon layer while maintaining a portion of the silicon layer in contact with the semiconductor substrate. The oxidizing may drive a portion of the dopant through the silicon layer and into the semiconductor substrate.
Public/Granted literature
- US20210398814A1 GATE INTERFACE ENGINEERING WITH DOPED LAYER Public/Granted day:2021-12-23
Information query
IPC分类: