Invention Grant
- Patent Title: Survey system
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Application No.: US16122028Application Date: 2018-09-05
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Publication No.: US11460299B2Publication Date: 2022-10-04
- Inventor: Nobuyuki Nishita
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Roberts Calderon Safran & Cole P.C.
- Priority: JPJP2017-179701 20170920
- Main IPC: G01C11/02
- IPC: G01C11/02 ; B64C39/02 ; B64D47/08 ; G01C11/30 ; G01S17/89 ; G01C15/00 ; G01S17/87 ; G01S17/66 ; G01S17/42 ; G05D1/00 ; G01S17/86

Abstract:
Provided is a survey system capable of more highly accurately obtaining a product of a three-dimensional survey. A survey system includes a mobile body, a scanner including an emitting unit, a light receiving unit, a distance measuring unit, a first optical axis deflecting unit disposed on an optical axis of the distance measuring light and configured to deflect a distance measuring light, a second optical axis deflecting unit disposed on a light receiving optical axis of the reflected distance measuring light and configured to deflect a reflected distance measuring light at the same angle in the same direction as those of the first optical axis deflecting unit, and an emitting direction detecting unit to detect deflection angles and directions of the first and the second optical axis deflecting units, a posture detecting device of the scanner, and a position measuring device of the scanner.
Public/Granted literature
- US20190086206A1 SURVEY SYSTEM Public/Granted day:2019-03-21
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