- 专利标题: Method of cleaning a substrate
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申请号: US16780049申请日: 2020-02-03
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公开(公告)号: US11495475B2公开(公告)日: 2022-11-08
- 发明人: Koji Maeda , Hiroshi Shimomoto , Hisajiro Nakano , Masayoshi Imai , Yoichi Shiokawa
- 申请人: EBARA CORPORATION
- 申请人地址: JP Tokyo
- 专利权人: EBARA CORPORATION
- 当前专利权人: EBARA CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Pearne & Gordon LLP
- 优先权: JP2012-220613 20121002
- 主分类号: H01L21/302
- IPC分类号: H01L21/302 ; H01L21/67 ; B24B37/34 ; B24B37/04
摘要:
Various methods of cleaning a substrate are provided. In one aspect, method of cleaning a substrate, comprising: holding and rotating a substrate by a substrate holder; and supplying a chemical liquid to a chemical liquid nozzle and supplying two fluids to a two-fluid nozzle while moving the chemical-liquid nozzle and the two-fluid nozzle radially outwardly from the center to the periphery of the substrate, wherein the distance of the chemical-liquid nozzle from a rotating axis of the substrate holder is longer than the distance of the two-fluid nozzle from the rotating axis of the substrate holder while the chemical-liquid nozzle and the two-fluid nozzle are moved radially outwardly from the rotating axis of the substrate holder.
公开/授权文献
- US20200176281A1 METHOD OF CLEANING A SUBSTRATE 公开/授权日:2020-06-04
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